Accutest - 103A Watch Circuit Tester

1st diffusion transisto ...

30 Jun 1955

Fairchild lead the industry from mesa-transistors to diffusion using Jean Hoerni's planar process, which would lay the foundation for the Integrated Circuit, Moore's Law, and would be the base process for almos ... See more

Canon - FPA-5000 ES2 Al ...

Canon - FPA-5000 ES2 Aligner :1990s - An early DUV scanner. ... See more

Genus - 1510 MeV Ion Im ...

30 Jun 1985

High-energy ion implanters, typically in the range of 1 to 3 MEV, were originally looked at in the late seventies but were never too successful. ... See more

Yan Borodovsky on DFM a ...

13 Sep 2007

Yan Borodovsky discusses DFM and Computational Lithography at Intel in historic 2007 interview. He covers what it’s about and how it’s a Chip Making Revolution ... See more

Fairchild Instrumentati ...

30 Jun 1965

This key piece of equipment was the granddaddy of most modern IC test systems and was the workhorse of the industry throughout the sixties and into the early seventies. A few could still be seen around in the 1 ... See more