Advantest - T3342 VLSI Test System

Advantest's 50th Annive ...

Advantest turned 50 on July 1, 2004. It was a milestone for one of Japan's greatest tech companies. This documents that history from the company's first product, the Micro Ammeter, through it's release of its g ... See more

Advantest: What made it ...

05 Jan 2006

Toshio Maruyama reflects on the history and future of Advantest and its role in semiconductor ATE. ... See more

Takeda Riken – Growt ...

Takeda Riken, the antecedent to Advantest, was hardly known outside Japan in 1980 and by 1985 it was driving the VLSI or Very Large Scale Integration ATE market as the largest company at the time fell back. Gro ... See more

Takeda Riken – Reliab ...

31 Mar 1983

Takeda Riken, the antecedent to Advantest, built it's brand on Semiconductor ATE reliability levels not seen previously outside of Japan ... See more

Takeda Riken Enters US ...

15 Jun 1982

Takeda Riken announces plans to enter the US ATE (automatic test equipment) market with a 5O-MHz logic semiconductor test system ... See more

Advantest - ATE Cost-Ef ...

Advantest - Improvements in Cost-Efficiency via parallel memory IC test highlights from this 1986 Annual Report excerpt ... See more

First Monolithic Silico ...

30 Jun 1955

1961: First Monolithic Silicon IC Chip. Invented by Robert Noyce, Fairchild ... See more

Intel 300mm Wafer Fab 1 ...

01 Jun 2004

This video is a manufacturing IT case study that shows Intel's first true 300mm manufacturing fab in Rio Rancho, New Mexico. While its first 300mm fab was in Oregon, it was dual-tasked with development. Here yo ... See more

Kumud Srinivasan on Fab ...

04 Jun 2004

Kumud Srinivasan, Director of Fab Automation, Intel discusses the status of Semiconductor Fab Automation at Intel in this 2004 interview. Find out where Intel was at the time and what it saw ahead in fab autom ... See more

Ultratech - Positive Ph ...

Ultratech - Positive Photoresist Develop Station Model 503 ... See more