Here's an excerpt from the 1985 Annual Report:
The development of Takeda Riken is intricately interwoven with the growth of an industry that has revolutionized the technologies serving the world. As the IC industry strives to crowd more electronic circuitry into less space, the requirements of test systems used in the IC production process become more complex. To meet these requirements. Takeda Riken began developing systems capable of dynamic functional testing by the late 1960's. In 1972, the company produced the first domestic LSI test system. Only seven years later. Takeda Riken developed the world's fastest VLSI test system with a speed of 100MHz.
Takeda Riken’s newest system, the T3341, based on the popular T3340. performs memory and logic tests and evaluates high-speed algorithmic gate arrays. The T3341 features new pattern generation, timing generation and data storage capabilities which make the optimum use of CAD systems. As a result, the T3341 is both more versatile and very reliable when testing new large-scale gate arrays and custom LSIs.
Presently. Takeda Riken has the world’s largest share of the memory test systems market Takeda Riken’s most sophisticated memory test system. the T3332. has the remarkable capability of testing up to sixteen VLSI memory devices simultaneously at 30MHz. thus greatly enhancing testing efficiency.
Takeda Riken – Excerpt from 1985 Annual Report - The Chip History
The use of microcomputers incorporating LSI's has brought about rapid advance in measuring instruments technology. This area of technology is referred to as "Intelligent Measurement