Semiconductor ATE

Summary : Automatic Test Systems (ATS) encompass a broad range of equipment-in size and in function as well as in price. It includes all equipment that is used to electrically verify a device's functionality. VLSI Research has adopted the automatic test systems flow chart listed in Figure 3.3.0.0-1. The categorization of test systems is further subsegmented in order to more appropriately group comparable test equipment. For example, logic testers are grouped into eight classes. These range from class 0 ... See More

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Annexure :

ATS is segmented into three sub-markets: Component test, burn-in and design diagnostics. Component test includes three sub-markets: Logic, memory and linear. Burn-in includes three sub-markets: Monitored, dynamic and static. Design diagnostics includes circuit probers and modification tools.

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