Semiconductor ATE

Summary : Automatic Test Systems (ATS) encompass a broad range of equipment-in size and in function as well as in price. It includes all equipment that is used to electrically verify a device's functionality. VLSI Research has adopted the automatic test systems flow chart listed in Figure 3.3.0.0-1. The categorization of test systems is further subsegmented in order to more appropriately group comparable test equipment. For example, logic testers are grouped into eight classes. These range from class ... See More

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Annexure :

ATS is segmented into three sub-markets: Component test, burn-in and design diagnostics. Component test includes three sub-markets: Logic, memory and linear. Burn-in includes three sub-markets: Monitored, dynamic and static. Design diagnostics includes circuit probers and modification tools.

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