Electroglas - Model 3001 Wafer Prober System

Electroglas Model 131B ...

30 Jun 1965

The elegant simplicity of this small machine belies the fact that an earlier ancestor was the granddaddy of all modern semiconductor automation. ... See more

KLA 200 Series Reticle ...

15 Jun 1984

KLA's Reticle Inspection System was the first automatic inspection system to ensure that killer defects as small as 0.7 microns on both reticles and photomasks would be detected. ... See more

In the final installment of this three-part interview, Jim Morgan expands on the strategies that made AMAT the successful company it is today. Topics covered include why perseverance works; balancing Kaizen m ... See more

Andy Grove on the devel ...

15 Jun 2004

Andy Grove talks at IMEC 2004 - the Intel Manufacturing Excellence Conference - about the history of manufacturing and how early practices entered into the Intel legacy flow. Topics include issues deploying new ... See more

X-TEK - HMX Xray Inspec ...

HMX Xray Inspection System : A high performance system for general non-destructive testing ... See more

Drytek - DRIE 100 Plasm ...

30 Jun 1985

The Drytek DRIE 100 plasma etcher was the template for all cluster tools that would follow. ... See more

Hitachi - HL-700, E-bea ...

Rare captively made e-beam system that would break out into the commercial world. ... See more

Varian - VLS 1000 Elect ...

30 Jun 1985

Remember when Varian was in the lithography business? You dont? Well, this was one of the top e-beam direct exposure systems in the early eighties. ... See more

CONVAC - Photo Mask Pro ...

CONVAC Photo mask processing equipment ... See more

Transistor Automation - ...

30 Jun 1975

Here is a workhorse of the early industry, the Teledyne TAC model XY540 wafer prober. An improved version of a still earlier transistor tester, it was revered by the manufacturing side of the industry for its l ... See more