A History Timeline of Automatic Test Equipment

Relevant Date :2006-06-15

Summary : A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment

a special presentation of

Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

The Development of Mega ...

02 Jan 1983

The system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). It was the first. ... See more

Reminiscences from the ...

The industry was in its childhood? When two or three Semicon trade shows covered the entire world? ... See more

IC Timeline

IC Timeline a special presentation of The Chip History Center. ... See more

Intel Fab 17 Circa 2000

15 Jun 2000

This video was shot inside a 200mm fab at Intel's Hudson, Massachusetts factory. ... See more

Paradigms of Maskless L ...

It is worth noting that this density of components can be achieved by present optical techniques and does not require the more exotic electron beam operations which are being studied for the possibility of maki ... See more