A History Timeline of Automatic Test Equipment

Relevant Date :2006-06-15

Summary : A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment

a special presentation of

The Development of the ...

02 Jan 1983

Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development ... See more

Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

BEOL Origins | The Chip ...

15 Feb 1995

When Back End of the Line wafer processing was new and emergent. ... See more

Moore’s Law GDP Value ...

13 Feb 2015

How the Moore’s Law raises income in relationship to the economies of the United States and the World. ... See more

Moore's Law: 40 Years a ...

01 Jan 2005

In 1965, Gordon Moore sat down to pen his article for Electronics magazine. Eventually, it would come to be known as Moore's Law. This is an overview, published Forty years later, celebrating how it was still g ... See more

History of Ion Implanta ...

15 Jun 1980

History of Ion Implantation Systems and their importance in the development of semiconductor manufacturing. Includes the roles William Shockley and Liechtenstein based Balzers played in the early development of ... See more

Semiconductor Dicing Eq ...

Dicing equipment is used to cut apart individual die on a wafer. Typically, a dicing saw will cut along the wafer in an unused section between dice that is called the 'street'. · Such streets are typically thre ... See more

SEMATECH - An Oral Hist ...

16 Jun 1992

An interview with Dave Anderson ... See more

A Brief History of Elec ...

200 years of deposition technology ... See more

Packaging Equipment - D ...

The early nineties, brought a renaissance to packaging due to a demand for more I/0, smaller sizes, higher power, faster speed and control of thermal properties. These demands drove the need for more sophistic ... See more

A History Timeline of Automatic Test Equipment

a special presentation of

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History of Ion Implanta ...

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Packaging Equipment - D ...