A History Timeline of Automatic Test Equipment

Relevant Date :2006-06-15

Summary : A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment

a special presentation of

The Development of the ...

02 Jan 1983

Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development ... See more

Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

Silicon Valley Genealog ...

AMD's and Intel's can be traced back to Fairchild and Shockley Transistor with this genealogy of semiconductor start-ups in Silicon Valley. The poster was created by SEMI poster. It shows the history of semicon ... See more

Ultratech’s History ...

29 Sep 2017

Founded in 1979 as Ultratech Stepper, it was the oldest stepper company in the world until its sale to Veeco in 2017. Used in the semiconductor lithography process, its stepper was unique in its use of a 1X len ... See more

Tencor at 20 Years

Tencor (later evolved to be KLA - Tencor) is in the bedrock of the semiconductor equipment industry. It developed many products that were essential to chip manufacturing. Some are still made today. ... See more

Customer Satisfaction L ...

15 Jun 2018

VLSI's Customer Satisfaction Survey Celebrates 30 Years of award winning semiconductor equipment companies. A Look Back... 2018 marked the 30th year VLSIresearch has released its annual Customer Satisfaction ... See more

Moore's Law: 40 Years a ...

01 Jan 2005

In 1965, Gordon Moore sat down to pen his article for Electronics magazine. Eventually, it would come to be known as Moore's Law. This is an overview, published Forty years later, celebrating how it was still g ... See more

Semiconductor ATE

Automatic Test Systems (ATS) encompass a broad range of equipment-in size and in function as well as in price. It includes all equipment that is used to electrically verify a device's functionality. VLSI Resear ... See more

Intel Timeline from 196 ...

A special presentation of The Chip History Center on Intel Timeline from 1968-1984 ... See more

Material Handling Syste ...

Material handling equipment serves as a physical, mechanical and electronic interface between test equipment and the device under test (DUT). It consists of three major subsegments commonly referred to as wafer ... See more

A History Timeline of Automatic Test Equipment

a special presentation of

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Semiconductor ATE

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Material Handling Syste ...