Summary : A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment
a special presentation of
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Megatest's MegaOne was the system that sparked the tester-per-pin revolution (19 ...
Jerry Hutcheson, VLSI Research's founder, was very active in the test side of th ...
IC Timeline a special presentation of The Chip History Center.
When Back End of the Line wafer processing was new and emergent.
Go inside a 200mm fab at Intel's Fab 17 Hudson, Massachusetts factory as it exis ...
Dicing equipment is used to cut apart individual die on a wafer. Typically, a di ...
Automatic Test Systems (ATS) encompass a broad range of equipment-in size and in ...
Bonding and inspection has historically been overlooked by upper management in s ...
The early nineties, brought a renaissance to packaging due to a demand for more ...
The sweeping revolution brought about by integrated circuits has caused change n ...
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