The Development of the First IC Tester-per-Pin ATE system

Time Period :1980'sRelevant Date :1983-01-02

Summary : Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development in the early 1980's. The concepts behind it were as important to testing as the jet engine was to aviation.

A History Timeline of A ...

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Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

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Key events drawn from archived documents in VLSI's library. These documents have been carefully selected for their historical significance. ... See more

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John Bardeen and Transi ...

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John Bardeen and Transistor Physics by Howard R. Huff, International SEMATECH ... See more

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The Near Impossibility ...

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This superb article, about the birth of the Perkin Elmer Projection Scanning Aligner, was first published in the Fall 1999 issue of American Heritage of Information & Technology. ... See more

Equipment Suppliers - 1 ...

This section examines the vendors who supply semiconductor manufacturing equipment. There are approximately 534 of them. The top five are shown below in Figure 2.0.0-1. In 1989, these five companies held a 26 ... See more

Process Diagnostics - D ...

Process diagnostic equipment is critical to semiconductor manufacture. Though this equipment is not used to directly manufacture devices, it serves to verify consistent and in-control manufacturing processes. ... See more