The Development of the First IC Tester-per-Pin ATE system

Time Period :1980'sRelevant Date :1983-01-02

Summary : Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development in the early 1980's. The concepts behind it were as important to testing as the jet engine was to aviation.

A History Timeline of A ...

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Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

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In 2004, ASML turned 20. This book was originally published to give employees an insight into the history of ASML and a vision of what the future was likely to bring. ... See more

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VLSI's Customer Satisfaction Survey Celebrates 30 Years of award winning semiconductor equipment companies. A Look Back... 2018 marked the 30th year VLSIresearch has released its annual Customer Satisfaction ... See more

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This video describes one of the most important factors in how AMD surged ahead to become a world leader in semiconductor manufacturing. In its description of APM, you get an aerial view and tour inside AMD's 20 ... See more

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There are three market segments of the diffusion/oxidation equipment industry. They are diffusion, high pressure oxidation and rapid thermal processing, as depicted in Figure 4.4.0-1. ... See more

Transistors to Integrat ...

16 Dec 1947

Transistors to Integrated Circuits: How the early semiconductor industry got from the Lab to the Fab. ... See more

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Ion implanters directly inject dopant atoms into semiconductor wafers. A gas containing atoms or molecules of the desired dopant 'species' is first ionized in an ion source. The ions are then extracted from the ... See more

Equipment Suppliers - 1 ...

This section examines the vendors who supply semiconductor manufacturing equipment. There are approximately 534 of them. The top five are shown below in Figure 2.0.0-1. In 1989, these five companies held a 26 ... See more

Material Handling Syste ...

Material handling equipment serves as a physical, mechanical and electronic interface between test equipment and the device under test (DUT). It consists of three major subsegments commonly referred to as wafer ... See more