The Development of the First IC Tester-per-Pin ATE system

Time Period :1980'sRelevant Date :1983-01-02

Summary : Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development in the early 1980's. The concepts behind it were as important to testing as the jet engine was to aviation.

A History Timeline of A ...

15 Jun 2006

A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment ... See more

Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

Moore's Law: 40 Years a ...

01 Jan 2005

In 1965, Gordon Moore sat down to pen his article for Electronics magazine. Eventually, it would come to be known as Moore's Law. This is an overview, published Forty years later, celebrating how it was still g ... See more

SRC 25th Anniversary

01 Jun 2007

The history and accomplishments of the Semiconductor Research Corporation ... See more

Environmental Health an ...

15 Sep 1994

The semiconductor industry has always worked hard to have and to maintain extremely high health and safety levels. ... See more

Microlithography & Mask ...

There are two essential applications for semiconductor lithography equipment. They are lumped together here under the name 'microlithography and mask making'. The two segments consist of mask-making equipment a ... See more

Intel Timeline from 196 ...

A special presentation of The Chip History Center on Intel Timeline from 1968-1984 ... See more

Explore Images of Histo ...

Key images drawn from donated and archived documents in VLSI's library. These images have been carefully selected for their historical significance as they show history in the making. ... See more

Introduction to Questor ...

Questor systems consist of those types of equipment used in the design, verification, handling, inspection and test of integrated circuits. This equipment, although critical in assuring device design or design ... See more

Process Diagnostics - D ...

Process diagnostic equipment is critical to semiconductor manufacture. Though this equipment is not used to directly manufacture devices, it serves to verify consistent and in-control manufacturing processes. ... See more