The Development of the First IC Tester-per-Pin ATE system: Megatest's MegaOne

Time Period :1980'sRelevant Date :1983-01-02

Summary : Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development in the early 1980's. The concepts behind it were as important to testing as the jet engine was to aviation.

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VLSI Research's History of the semiconductor equipment industry covers its development from its earliest years up around 1990. Shows specific histories for Automatic Test Equipment - ATE, semiconductor assembly ... See more

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When the death of Moore ...

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Crashing into Moore's Wall is like a conspiracy theory: it can never be disproved to the true believers that our industry is about to run into a wall that has never appeared. Back in the mid-nineties, Scientifi ... See more