The Development of the First IC Tester-per-Pin ATE system

Time Period :1980'sRelevant Date :1983-01-02

Summary : Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development in the early 1980's. The concepts behind it were as important to testing as the jet engine was to aviation.

A History Timeline of A ...

15 Jun 2006

A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment ... See more

Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

Moore’s Law GDP Value ...

13 Feb 2015

How the Moore’s Law raises income in relationship to the economies of the United States and the World. ... See more

Copper Interconnect – ...

15 Jun 1998

The transition from aluminum to copper wiring in semiconductor process technology is discussed in this interview with Anantha Sethuraman, with particular emphasis on the inspection technology and the role marke ... See more

SEMATECH - An Oral Hist ...

16 Jun 1992

An interview with Dave Anderson ... See more

Paradigms of Maskless L ...

The replacement of optical lithography with e-beam direct write for semiconductor manufacturing has been predicted since Gordon Moore penned his 1965 paper, writing "It is worth noting that this density of comp ... See more

Transistors to Integrat ...

16 Dec 1947

Transistors to Integrated Circuits: How the early semiconductor industry got from the Lab to the Fab. ... See more

Process Diagnostics - D ...

Process diagnostic equipment is critical to semiconductor manufacture. Though this equipment is not used to directly manufacture devices, it serves to verify consistent and in-control manufacturing processes. ... See more

Etching & Cleaning - De ...

Dry processing methods are chemical processes that use a plasma to drive the reaction. Dry etching is the major segment of dry processing. Today, virtually all etching processes are dry processes. Typically, ... See more

Material Handling Syste ...

Material handling equipment serves as a physical, mechanical and electronic interface between test equipment and the device under test (DUT). It consists of three major subsegments commonly referred to as wafer ... See more