Nippon Seiko - TZ-310 Exposure System

30 Jun 1995

Though not the first step & scan system—that honor goes to Perkin Elmer—this ...

24 May 2018

In 1968, standard clean room practices were lax. Facilities were kept reasonably ...

30 Jun 1985

The tool that sparked the yield management revolution.

Significant improvement in manufacturing worthiness for the first Step-and-Scan ...

29 Nov 2004

Barry Rapozo was honored for the establishment of selling processes in wafer fab ...

30 Jun 1975

Remember air track? It was all the rage in the days when technocool won out ove ...

30 Jun 1985

This system, from about 1988, represents one of the most successful tungsten dep ...

CONVAC compact equipment is derived from fully developed components of Module 20 ...

Electroglas - Model 3001 Wafer Prober System :1990s

30 Jun 1965

During many of the early years, in a little shop on Arques Avenue in Sunnyvale, ...