Leica - VB 5/6 and ZBA 31H/32 E-Beam tools:

KLA 200 Series Reticle ...

15 Jun 1984

KLA's Reticle Inspection System was the first automatic inspection system to ensure that killer defects as small as 0.7 microns on both reticles and photomasks would be detected. ... See more

Applied Materials - P50 ...

Applied Materials - P5000, Etcher :1985-89 - Followed the 8300, but was eclipsed. ... See more

Technology, Circa 1981 – It's often the overlooked news that turn out to be critical turning points. The pellicle was one such event. Being able to inspect them was even more critical and a large barrier to o ... See more

Fairchild Systems Techn ...

30 Jun 1975

Possibly the 1st high speed, high pin count, LSI Test System. ... See more

The Turn Around at Fair ...

05 Jan 2006

Jim Bowen talks about how he took Fairchild Test Systems Group from a money loser to the world's largest semiconductor equipment company during the seventies and how mismanagement led to its destruction after h ... See more

Yan Borodovsky: Breakin ...

13 Sep 2007

Ever wonder how innovation really happens? Think it's someone sitting back and dreaming up an idea? In this video, Yan Borodovsky, describes how it starts with a nuisance that grows until you do something about ... See more

Westech - Model 372 Waf ...

30 Jun 1985

They had the world on a string and were sitting on a rainbow, but had no idea of what a customer was. The industry's most significant marketing failure of the nineties. ... See more

Muhlbauer - VideoSem, D ...

The VideoSem 2010 is a fully automatic vision system for die bond inspection. ... See more

Semiconductor Systems - ...

Semiconductor Systems' new System 200 is state-of-the-art equipment for submicron lithography that is designed for the greatest flexibility now, and in the future. ... See more

Excerpt from 1984 Annua ...

Lam Research Corporation was founded in 1980 when advance in micro miniaturization technology produce dramatic changes in the way that integrated circuits were made. ... See more