Summary : Significant improvement in manufacturing worthiness for the first Step-and-Scan series.
Introducing Micrascan III+ for Critical Level Lithography
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Jim Bowen talks about how he took Fairchild Test Systems Group from a money lose ...
This key piece of equipment was the granddaddy of most modern IC test systems an ...
Mihir on the History of Automation in the Semiconductor Industry
The push for sub-micron line features sprouted several experimental attempts, am ...
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