Summary : Technology, Circa 1981 – It's often the overlooked news that turn out to be critical turning points. The pellicle was one such event. Being able to inspect them was even more critical and a large barrier to overcome.
Tencor (later evolved to be KLA - Tencor) is in the bedrock of the semiconducto ...
This technical paper laid out the future of yield management, covering all the i ...
KLA's Reticle Inspection System was the first automatic inspection system to ens ...
The tool that sparked the yield management revolution.
Technology, Circa 1991 – As lithography moved into ever lower k factors, the c ...
The dawn of automated inspection. KLA's mask inspection tools took over to see w ...
Rare captively made e-beam system that would break out into the commercial world ...
OmniChuck Advanced Wafer Processing System
Applied Materials - Silox Model AMS 2600 & 2660 :1960s - An early tool for low t ...
Ed Segal was honored for his establishment of a global representative organizati ...
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