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1961: First Monolithic Silicon IC Chip. Invented by Robert Noyce, Fairchild
KLA's Reticle Inspection System was the first automatic inspection system to ens ...
Possibly the 1st high speed, high pin count, LSI Test System.
Suspended vertical laminar flow stations from Micro Air fulfill a variety of nee ...
Anelva - MBE 831 Molecular Beam Epitaxy System :1985-89
Here are two fine examples of third optical inspection systems when such systems ...
A 6th gen maskless litho tool from the early 80's.
Applied Materials - CA-800 Mask Aligner and Exposure System: :1980-84
Applied Materials - PECVD_application-bulletin :1970s
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