Setek - MS-610 Series Resist Processing

01 Jun 1966

This famous test system was the first truly computer-controlled IC test system.

30 Jun 1975

Possibly the 1st high speed, high pin count, LSI Test System.

HMX Xray Inspection System : A high performance system for general non-destruct ...

30 Jun 1985

The Drytek DRIE 100 plasma etcher was the template for all cluster tools that wo ...

30 Jun 1985

Well known in the U.S. as a Marubeni import, Shinkawa’s wire bonders had also ...

Suspended vertical laminar flow stations from Micro Air fulfill a variety of nee ...

Cobilt - Model AF110 Brushless Scrubber :1980-84

30 Jun 1985

Cameca was a European based attempt from the research department of Thomson CSF ...

Applied Materials - CA-2020H Mask Aligner :1980-84

18 Jun 1985

The Dawn of the CD SEM came with Hitachi’s (now Hitachi High-Technologies) add ...