KULICKE & SOFFA - 50th Anniversary

Ever wonder how the nanochips you see in pictures wind up covered in plastic on ...

Kulicke & Soffa Model 1471 High Productivity Wedge Bonder

AMD's and Intel's can be traced back to Fairchild and Shockley Transistor with t ...

15 Jul 2017

One of our industry legends, Nick DeWolf, has passed on. DeWolf co-founded Tera ...

Significant improvement in manufacturing worthiness for the first Step-and-Scan ...

06 Dec 2006

Bill Tobey on his 2006 Bob Graham Award and Lessons Learned

30 Jun 1965

This logic tester represented another early attempt at capturing the automatic t ...

31 Dec 1969

High Throughput Bumped Wafer Characterization System

30 Jun 1985

The push for sub-micron line features sprouted several experimental attempts, am ...

30 Jun 1975

Here is a workhorse of the early industry, the Teledyne TAC model XY540 wafer pr ...