Teradyne - J973 VLSI Test System

The Father of ATE (Auto ...

15 Jul 2017

One of our industry legends, Nick DeWolf, has passed on. DeWolf co-founded Teradyne with Alex d'Arbeloff, who together built our industrys ATE business. ... See more

Alex d'Arbeloff on Tera ...

23 May 2006

How Teradyne got started and what it was like to be a start-up in the sixties. ... See more

Teradyne J259 IC Test S ...

01 Jun 1966

This famous test system was the first truly computer-controlled IC test system. ... See more

Tetsuo (Tom) Tsuneishi ...

Tetsuo (Tom) Tsuneishi for providing the strategic vision behind Tokyo Electron’s successful history ... See more

Jim Bowen talks about how he took Fairchild Test Systems Group from a money loser to the world's largest semiconductor equipment company during the seventies and how mismanagement led to its destruction after h ... See more

Decision Making at Inte ...

21 Jan 2008

Bill Holt on Business Incentives for Semiconductor R&D ... See more

Fairchild Instrumentati ...

30 Jun 1965

This key piece of equipment was the granddaddy of most modern IC test systems and was the workhorse of the industry throughout the sixties and into the early seventies. A few could still be seen around in the 1 ... See more

ASM Assembly Automation ...

30 Jun 1985

Here are two fine examples of third optical inspection systems when such systems were at their zenith. Used in assembly to accept, rework or reject wire bonds in un-lidded packages prior to sealing, the 3rd Op ... See more

Applied Materials - SPC ...

Applied Materials - SPCVD-4000 :1960s - An LPCVD tool from a time when Applied could do little right. The vacuum pump created a vibration that caused wafers to rotate in their boat. It was one of the tools Jim ... See more

Applied Materials - CA- ...

Applied Materials - CA-2020H Mask Aligner :1980-84 ... See more