Open ATE Architecture: ATE Executive View

Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video

Structural vs Functional Test: Which is better?

Dan Maydan talks about how Applied Materials built it into a multi-billion dolla ...

Jim Bowen talks about how he took Fairchild Test Systems Group from a money lose ...

The development of Hi-k Dielectric Materials mark a key turning point in the his ...

Hans Stork discusses the future of photonics and optical interconnect in this hi ...

Mihir Parikh tells us about the big Automation Do's and Don'ts

Dave Anderson: General Manager, ATDF: What ATDF’s All About

Chip execs, Bill Arnold, Gene Fuller, and Phil Ware weigh in on the then new FAS ...

Edmund Cheng: VP of Marketing, Synopsys: Design-For-Manufacturing (DFM)