Paul Magliocco discusses NexTest's Position on Open Architecture for testing semiconductors.
Paul Magliocco discusses NexTest's Position on Open Architecture for testing semiconductors.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Structural vs Functional Test: Which is better?
Mark Bohr, Intel Fellow, Director of Process Architecture and Integration discus ...
Bill Tobey on his 2006 Bob Graham Award and Lessons Learned
Paul Otellini was the first to pass from the semiconductor industry’s sec ...
Mihir Parikh tells us about the big Automation Do's and Don'ts
Tom Franz: Vice President, General Manager, Fab/Sort Manufacturing, Intel: Intel ...
Mark Jagiela, President of Teradyne Semi Group, on... Is it possible to have a n ...
Jim Healy: President & CEO, LogicVision: Latest Trends in Design For Test
Sunit Rikhi: Director of Advanced Design, Logic Technology Development, Intel: D ...
Access to and use of this Website is subject to VLSI's Terms of Use (including Copyright Policy & Claims) and Privacy Policy. By accessing or using this Website you agree to VLSI's Terms of Use (including Copyright Policy & Claims) and Privacy Policy.
Copyright © 2021 VLSI Research Inc. All rights reserved.