Open ATE Architecture: ATE Executive View

Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video

Structural vs Functional Test: Which is better?

Mark Bohr, Intel Fellow, Director of Process Architecture and Integration discus ...

Bill Tobey on his 2006 Bob Graham Award and Lessons Learned

Paul Otellini was the first to pass from the semiconductor industry’s sec ...

Mihir Parikh tells us about the big Automation Do's and Don'ts

Tom Franz: Vice President, General Manager, Fab/Sort Manufacturing, Intel: Intel ...

Mark Jagiela, President of Teradyne Semi Group, on... Is it possible to have a n ...

Jim Healy: President & CEO, LogicVision: Latest Trends in Design For Test

Sunit Rikhi: Director of Advanced Design, Logic Technology Development, Intel: D ...