Open ATE Architecture: ATE Executive View

Interviewed :Paul MaglioccoRelevant Date :2003-06-18

Summary : Paul Magliocco discusses NexTest's Position on Open Architecture for testing semiconductors.

Annexure :

Paul Magliocco discusses NexTest's Position on Open Architecture for testing semiconductors.

Paul Magliocco

18 Jun 2003

Paul Magliocco: New Rea ...

Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video ... See more

Paul Magliocco

18 Jun 2003

Paul Magliocco: Structu ...

Structural vs Functional Test: Which is better? ... See more

Jim Bowen talks about how he took Fairchild Test Systems Group from a money loser to the world's largest semiconductor equipment company during the seventies and how mismanagement led to its destruction after h ... See more

Jim Morgan

16 Mar 2006

Building a Global Posit ...

The second part of this three-part interview covers Applied Materials in the 1980s and its transformation into a global company. Jim Morgan talks about Japan, the Rule of Three, SEMI, and his vision of a globa ... See more

Yan Borodovsky

13 Sep 2007

Yan Borodovsky on DFM a ...

Yan Borodovsky discusses DFM and Computational Lithography at Intel in historic 2007 interview. He covers what it’s about and how it’s a Chip Making Revolution ... See more

Mike Splinter

08 Jun 2004

Audience Q&A

Mike Splinter: President & CEO of Applied Materials: Audience Q&A ... See more

Hans Stork on customer inv ...

18 Jul 2003

The rise of customer in ...

Hans Stork discusses trends in the level of customer involvement during technology development marking a strategic inflection point for the semiconductor industry. ... See more