Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Charlie Sporck reflects back on what he learned over the years, offering his adv ...
In this segment, Wilf Corrigan details the structural ingredients of the ASIC se ...
In the final installment of this three-part interview, Jim Morgan expands on the ...
Bill Tobey on his 2006 Bob Graham Award and Lessons Learned
William Holt: Vice President & GM, Technology and Manufacturing Group, Intel: St ...
Nick Konidaris: President & CEO of Electro Scientific Industries, Inc.: New Syst ...
Sunit Rikhi: Director of Advanced Design, Logic Technology Development, Intel: D ...
Semiconductor Test Consortium (STC) Panel 2008: Q & A
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