Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Charlie Sporck reflects back on what he learned over the years, offering his adv ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on what will be t ...
Test Panel: B. Price, Philips on... Open Architecture
Mark Jagiela, President of Teradyne Semi Group, on... Is it possible to have a n ...
Dick Deininger on Joint Process Development with IBM
Gary Patton: VP, Semiconductor Research and Development Center, IBM: IBM’s 32n ...
Mike Splinter: President and CEO of Applied Materials: New Plays in Materials, P ...
Mike Polcari: CEO of SEMATECH: Current Trends in Semiconductor Research
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