Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Bill Tobey on his 2006 Bob Graham Award and Lessons Learned
Dan Maydan talks about how Applied Materials built it into a multi-billion dolla ...
Lithography Panel 2008: Audience Q&A
Test Panel: B. Price, Philips on... Open Architecture
Scott Kulicke, discusses the challenges going forward in semiconductor packaging ...
Chandra Mouli: Director, Automated Manufacturing Technology, Intel: Enabling Int ...
Will there be a new wafer exposure technology before EUV makes it to production? ...
Jack Trautman, Sr VP & GM of ATE Group at Agilent: Audience Q&A
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