Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
How the SIA got started is an video interview with the legendary Wilf Corrigan w ...
Art Zafiropoulo was honored for championing technology through innovative market ...
The development of Hi-k Dielectric Materials mark a key turning point in the his ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on consolidation ...
Tom Franz: Vice President, General Manager, Fab/Sort Manufacturing, Intel: Intel ...
Dave Anderson: General Manager, ATDF: What ATDF’s All About
In this historic 2003 video, Hans Stork discusses the status of Low-k Interconne ...
Mark Jagiela, President of Teradyne Semi Group, on... Teradyne joining consortiu ...
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