Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Martin van den Brink, employee number 1 at ASML, describes what it's been like t ...
How Teradyne got started and what it was like to be a start-up in the sixties.
Craig Barrett, Chairman of Intel, describes why America is losing its edge and w ...
Sound Boring? Hear how very successful people have used Math & Science to make t ...
Lithography Panel 2007: Audience Q&A
Nick Konidaris: President & CEO of Electro Scientific Industries, Inc.: New Syst ...
Hans Stork, then Senior Vice President of Silicon Technology Development at Texa ...
Edmund Cheng: VP of Marketing, Synopsys: Design-For-Manufacturing (DFM)
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