Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Sunlin Chou, who passed December 5th, 2018, and his contributions to the semicon ...
Jim Bowen talks about how he took Fairchild Test Systems Group from a money lose ...
Barry Rapozo was honored for the establishment of selling processes in wafer fab ...
Dick Deininger on Advanced Process Control
Dan Mahoney: President and CEO, Renesas Technology America, Inc.: Renesas” ...
Henry Becker: President, Qimonda North America: Introducing Qimonda and Defining ...
Dick Deininger on Joint Process Development with IBM
Mike Splinter: President and CEO of Applied Materials: New Plays in Materials, P ...
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