Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Bob Noyce left Fairchild in 1968 to found Intel with Gordon Moore and Andy Grove ...
Sound Boring? Hear how very successful people have used Math & Science to make t ...
Jerry Hutcheson was honored for pioneering and developing relational databases o ...
Steve Nakayama honored for his contribution in helping globalize the semiconduct ...
Dave Anderson: General Manager, ATDF: What ATDF’s All About
Sunit Rikhi: Vice President, Technology and Manufacturing Group, Intel: Extreme ...
Lithography Panel 2007: Bill Arnold, ASML
Hans Stork, then Senior Vice President of Silicon Technology Development at Texa ...
Access to and use of this Website is subject to TechInsights' Terms of Use (including Copyright Policy & Claims) and Privacy Policy. By accessing or using this Website you agree to TechInsights' Terms of Use (including Copyright Policy & Claims) and Privacy Policy.
Copyright © 2025 TechInsights Inc. All rights reserved.