Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
In the final installment of this three-part interview, Jim Morgan expands on the ...
Craig describes the origins of manufacturing lore such as Copy Exactly, Intel U, ...
If you spend anytime researching Silicon Valley, you will find the name Robert N ...
Charlie Sporck arrived at Fairchild Semiconductor in 1959. Between then and thro ...
Anantha Sethuraman: CEO of DFMSim: Introducing DFMSim
In 2003, Bernie Meyerson, CTO at IBM's Microelectronics Division, shocked the wo ...
Lithography Panel 2007: Gene Fuller, Nikon
Jerry Cutini: President & CEO of Aviza Technology: The Opportunity for Mid-Tier ...
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