Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
How Teradyne got started and what it was like to be a start-up in the sixties.
The development came from an unlikely company: Perkin Elmer. Dave Markle was the ...
In 2003, Bernie Meyerson, CTO at IBM's Microelectronics Division, shocked the wo ...
In this segment, Wilf Corrigan details the structural ingredients of the ASIC se ...
Mihir Parikh tells us about the big Automation Do's and Don'ts
Jim Healy was honored for the establishment of industry specific selling process ...
Intel's Chiang Yang talks about what's new in photomask technology and how Intel ...
Dick Deininger: Where is APC used?
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