Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Toshio Maruyama reflects on the history and future of Advantest and its role in ...
Anantha Sethuraman: CEO of DFMSim: Introducing DFMSim
Semiconductors were starting to become big business by the mid-sixties. Assembly ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on what will be t ...
Keith Lee: President and CEO, Advantest America: Advantest’s strategies d ...
Mike Mayberry: VP, Technology and Manufacturing Group, Director of Components Re ...
In this segment, learn from Wilf why learning the fundamentals are so important ...
Michael Polcari: President & CEO of International SEMATECH: What's New at SEMATE ...
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