Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Barry Rapozo was honored for the establishment of selling processes in wafer fab ...
Hans Stork discusses trends in the level of customer involvement during technolo ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on what will be t ...
Mihir Parikh tells us about the big Automation Do's and Don'ts
Semiconductor Test Consortium (STC) Panel 2008: Klaus Luther, Infineon
Nick Konidaris: President & CEO of Electro Scientific Industries: Laser Repair
Hans Stork, then Senior Vice President of Silicon Technology Development at Texa ...
Dan Mahoney: President and CEO, Renesas Technology America, Inc.: Renesas’ Ama ...
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