Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Bill Tobey on his 2006 Bob Graham Award and Lessons Learned
Anantha Sethuraman: CEO of DFMSim: Introducing DFMSim
Lithography Panel 2008: Andrew Hazelton, Nikon
Jim Bowen talks about how he took Fairchild Test Systems Group from a money lose ...
Hans Stork discusses the future of photonics and optical interconnect in this hi ...
Mike Mayberry: VP, Technology and Manufacturing Group, Director of Components Re ...
Dan Mahoney: President and CEO, Renesas Technology America, Inc.: Renesas’ Ama ...
Test Panel: Audience Q&A on... Open Architecture
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