Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
How he turned a technology, critial to the future of Moore's Law and the semicon ...
Charlie Sporck arrived at Fairchild Semiconductor in 1959. Between then and thro ...
Anantha Sethuraman: CEO of DFMSim: Introducing DFMSim
Bill Holt on Business Incentives for Semiconductor R&D
Gary Heerssen, AMD's Senior Vice President of Corporate Manufacturing, passed aw ...
Charlie was an instrumental part of beating Japan at its own game: manufacturing ...
G. Dan Hutcheson: CEO of VLSI Research Inc: The Shifting Winds of Power
Lithography Panel 2007: Bill Arnold, ASML
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