Paul Magliocco: Structural vs Functional Test

Interviewed :Paul MaglioccoRelevant Date :2003-06-18

Summary : Structural vs Functional Test: Which is better?

Annexure :

Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.

Paul Magliocco

18 Jun 2003

Paul Magliocco: New Rea ...

Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video ... See more

Paul Magliocco

18 Jun 2003

Open ATE Architecture: ...

Paul Magliocco discusses NexTest's Position on Open Architecture for testing semiconductors. ... See more

Sunlin Chou: A tribute

05 Dec 2018

Sunlin Chou: A tribute

Sunlin Chou, who passed December 5th, 2018, and his contributions to the semiconductor industry. Sunlin’s role was to develop a new business model for research and development. ... See more

How the continuation of Moore’s law provides a foundation for future economic growth; how it’s broken down the red brick walls in its path; what barriers are believed to loom today; how they might be releva ... See more

Ken David

27 Oct 2003

The First Hi-k Dielectr ...

The development of Hi-k Dielectric Materials mark a key turning point in the history of the semiconductor industry. By the early 2000’s, IC integration scale was reaching a limit that threatened Moore’s Law ... See more

Bob Halliday

03 Sep 2005

The Role of CFO at a Se ...

Bob Halliday, Executive VP & CFO, Varian Semiconductor talks about managing the financial health of a Semiconductor Equipment Company soon after public companies made the transition into the Sarbanes-Oxley era. ... See more

Mike Goldstein & Daisuke O ...

23 Jan 2008

First 450mm Wafer from ...

Nippon Mining & Metals: Daisuke Oka, Strategic Account Manager & Intel: Mike Goldstein, Principal-Materials Engineer: First 450mm Wafer from Nippon Mining & Metals ... See more