Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Dan Maydan talks about the early days of turning Applied Materials into a techno ...
Anantha Sethuraman: CEO of DFMSim: Introducing DFMSim
Lithography Panel 2008: Andrew Hazelton, Nikon
In 2003, Bernie Meyerson, CTO at IBM's Microelectronics Division, shocked the wo ...
Jim Bowen talks about how he took Fairchild Test Systems Group from a money lose ...
Lithography Panel 2008: Audience Q&A
Tom Franz: Vice President, General Manager, Fab/Sort Manufacturing, Intel: Intel ...
Hans Stork addresses the role E-beam maskless lithography for low-volume semicon ...
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