Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Mark Bohr discusses process technology development on Intel's 65nm Process in th ...
Dan Maydan talks about the early days of turning Applied Materials into a techno ...
Bob Noyce's early career is probably best known for inventing the IC. But it was ...
Ken Schroeder, then President & CEO of KLA-Tencor, discusses the history of proc ...
What About Bob - Robert Graham's video biography of his career with comments abo ...
Dick Deininger on Advanced Process Control
STC Panel 2007: How Industry Standards Improve Test Productivity
If you spend anytime researching Silicon Valley, you will find the name Robert N ...
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