Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
One of our industry legends, Nick DeWolf, has passed on. DeWolf co-founded Tera ...
Craig describes the origins of manufacturing lore such as Copy Exactly, Intel U, ...
Charlie was an instrumental part of beating Japan at its own game: manufacturing ...
Nasser Grayeli: Vice President, Technology & Manufacturing Group, and Director, ...
G. Dan Hutcheson: CEO of VLSI Research Inc: The Shifting Winds of Power
Semiconductor Test Consortium (STC) Panel 2008: Bob Helsel, Bode Enterprises
Mike Splinter: President & CEO of Applied Materials: AMAT: One Year After
Dan Mahoney: President and CEO, Renesas Technology America, Inc.: Renesas” ...
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