Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Craig describes the origins of manufacturing lore such as Copy Exactly, Intel U, ...
Jim Bowen talks about how he took Fairchild Test Systems Group from a money lose ...
Ken Schroeder, then President & CEO of KLA-Tencor, discusses the history of proc ...
Bill Holt on Business Incentives for Semiconductor R&D
Mihir on the History of Automation in the Semiconductor Industry
Dick Deininger on Advanced Process Control
Lithography Panel 2007: Bill Arnold, ASML
Test Panel: P. Roddy, Freescale on... Open Architecture
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