Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Sunlin Chou discusses how managing these parameters have evolved over time, in t ...
In the final installment of this three-part interview, Jim Morgan expands on the ...
Ken Schroeder, then President & CEO of KLA-Tencor, discusses the history of proc ...
Bob Halliday, Executive VP & CFO, Varian Semiconductor talks about managing the ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on what will be t ...
Jerry Hutcheson was honored for pioneering and developing relational databases o ...
Hans Stork addresses the role E-beam maskless lithography for low-volume semicon ...
Keith Lee: President and CEO, Advantest America: Advantest’s strategies during ...
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