Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
How he turned a technology, critial to the future of Moore's Law and the semicon ...
Ken Schroeder, then President & CEO of KLA-Tencor, discusses the history of proc ...
Yan Borodovsky discusses DFM and Computational Lithography at Intel in historic ...
Mark Bohr, Intel Senior Fellow, Technology and Manufacturing Group discusses mov ...
Tom Caulfield: Executive VP of Sales, Marketing, and Customer Service, Novellus: ...
Chandra Mouli: Director, Automated Manufacturing Technology, Intel: Enabling Int ...
Sean Maloney: Executive VP and GM, Mobility Group, Intel: Dynamic Duo
Test Panel: P. Roddy, Freescale on... Open Architecture
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