Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Kazuo Ushida: President, Nikon Precision Equipment Company: Advancing Nano-Litho ...
What About Bob - Robert Graham's video biography of his career with comments abo ...
Craig Barrett, Chairman of Intel, describes why America is losing its edge and w ...
Aart de Geus: Chairman & CEO, Synopsys: Current Trends in EDA
Jerry Hutcheson was honored for pioneering and developing relational databases o ...
Mike Splinter: President & CEO of Applied Materials: Audience Q&A
Nick Konidaris: President & CEO of Electro Scientific Industries, Inc.: New Syst ...
Mark Jagiela, President of Teradyne Semi Group, on... Teradyne joining consortiu ...
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