Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
One of our industry legends, Nick DeWolf, has passed on. DeWolf co-founded Tera ...
Craig Barrett, Chairman of Intel, describes why America is losing its edge and w ...
In this segment, Wilf Corrigan details the structural ingredients of the ASIC se ...
Hans Stork addresses the role E-beam maskless lithography for low-volume semicon ...
In this historic 2003 video, Hans Stork discusses the status of Low-k Interconne ...
Semiconductor Test Consortium (STC) Panel 2008: Steve Wigley, LTX
Mike Splinter: President & CEO of Applied Materials: AMAT: One Year After
Test Panel: Audience Q&A on... Open Architecture
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