Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Dan Maydan talks about the early days of turning Applied Materials into a techno ...
Mark Bohr, Intel Fellow, Director of Process Architecture and Integration discus ...
Art Zafiropoulo: Chairman and CEO, Ultratech: How Organic Growth Beats Acquisiti ...
G. Dan Hutcheson: CEO of VLSI Research Inc: The Shifting Winds of Power
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on the question o ...
In this historic 2003 video, Hans Stork discusses the status of Low-k Interconne ...
Mike Polcari: CEO of SEMATECH: Current Trends in Semiconductor Research
Dan Mahoney: President and CEO, Renesas Technology America, Inc.: Renesas’ Ama ...
Access to and use of this Website is subject to VLSI's Terms of Use (including Copyright Policy & Claims) and Privacy Policy. By accessing or using this Website you agree to VLSI's Terms of Use (including Copyright Policy & Claims) and Privacy Policy.
Copyright © 2020 VLSI Research Inc. All rights reserved.