Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Mark Bohr: Senior Fellow and Director of Process Architecture & Integration, Int ...
Mark Bohr, Intel Senior Fellow, Technology and Manufacturing Group discusses mov ...
Sunit Rikhi: Vice President, Technology and Manufacturing Group, Intel: Extreme ...
Gary Patton: VP, Semiconductor Research and Development Center, IBM: IBM’s 32n ...
Dave Anderson: General Manager, ATDF: What ATDF’s All About
In this historic 2003 video, Hans Stork discusses the status of Low-k Interconne ...
Sean Maloney: Executive VP and GM, Mobility Group, Intel: Dynamic Duo
Chip execs, Bill Arnold, Gene Fuller, and Phil Ware weigh in on the then new FAS ...
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