Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
The development of Hi-k Dielectric Materials mark a key turning point in the his ...
Kumud Srinivasan, Director of Fab Automation, Intel discusses the status of Semi ...
Robert Noyce has been called the father of Silicon Valley. A giant among giants, ...
Test Panel: B. Price, Philips on... Open Architecture
Semiconductor Test Consortium (STC) Panel 2008: Don Edenfeld, Intel
Gary Patton: VP, Semiconductor Research and Development Center, IBM: IBM’s 32n ...
Lithography Panel 2007: Audience Q&A
Dick Deininger on Joint Process Development with IBM
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