Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
How the SIA got started is an video interview with the legendary Wilf Corrigan w ...
Keith Lee: President and CEO, Advantest America: Advantest’s strategies during ...
Hans Stork addresses the role E-beam maskless lithography for low-volume semicon ...
Sean Maloney: Executive VP and GM, Mobility Group, Intel: Dynamic Duo
Test Panel: Audience Q&A on... Open Architecture
Mike Polcari: CEO of SEMATECH: Current Trends in Semiconductor Research
Edmund Cheng: VP of Marketing, Synopsys: Design-For-Manufacturing (DFM)
Chip execs, Bill Arnold, Gene Fuller, and Phil Ware weigh in on the then new FAS ...
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