Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Mark Bohr discusses process technology development on Intel's 65nm Process in th ...
Mark Bohr: Senior Fellow and Director of Process Architecture & Integration, Int ...
Charlie Sporck arrived at Fairchild Semiconductor in 1959. Between then and thro ...
Anantha Sethuraman: CEO of DFMSim: Introducing DFMSim
The second part of this three-part interview covers Applied Materials in the 198 ...
In this historic 2003 video, Hans Stork discusses the status of Low-k Interconne ...
Keith Lee: President and CEO, Advantest America: Advantest’s strategies during ...
Jim Healy: President & CEO, LogicVision: Latest Trends in Design For Test
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