Paul Magliocco: Structural vs Functional Test

Interviewed :Paul MaglioccoRelevant Date :2003-06-18

Summary : Structural vs Functional Test: Which is better?

Annexure :

Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.

Paul Magliocco

18 Jun 2003

Paul Magliocco: New Rea ...

Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video ... See more

Paul Magliocco

18 Jun 2003

Open ATE Architecture: ...

Paul Magliocco discusses NexTest's Position on Open Architecture for testing semiconductors. ... See more

Mark Bohr, Intel Fellow, Director of Process Architecture and Integration discusses the launch of Intel's then new P1262 90nm Process in this historic interview. In 2002, 90nm was the cutting edge of semiconduc ... See more

Mihir Parikh

13 Aug 2008

Mihir on the History of ...

Mihir on the History of Automation in the Semiconductor Industry ... See more

Kumud Srinivasan

04 Jun 2004

Kumud Srinivasan on Fab ...

Kumud Srinivasan, Director of Fab Automation, Intel discusses the status of Semiconductor Fab Automation at Intel in this 2004 interview. Find out where Intel was at the time and what it saw ahead in fab autom ... See more

Hans Stork on customer inv ...

18 Jul 2003

The rise of customer in ...

Hans Stork discusses trends in the level of customer involvement during technology development marking a strategic inflection point for the semiconductor industry. ... See more

Charlie Sporck

17 Oct 2007

Going Off-Shore

Semiconductors were starting to become big business by the mid-sixties. Assembly was the bulk of the cost and the giants in Japan and the Southwest were building automated assembly lines to deal with the cost. ... See more