Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Kazuo Ushida: President, Nikon Precision Equipment Company: Advancing Nano-Litho ...
Bob Noyce left Fairchild in 1968 to found Intel with Gordon Moore and Andy Grove ...
What About Bob - Robert Graham's video biography of his career with comments abo ...
Yan Borodovsky discusses DFM and Computational Lithography at Intel in historic ...
Lithography Panel 2008: Bill Arnold, ASML
Semiconductor Test Consortium (STC) Panel 2008: Steve Wigley, LTX
Lithography Panel 2007: Bill Arnold, ASML
Test Panel: D. Edenfeld, Intel on... Open Architecture
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