Test Panel: D. Edenfeld, Intel on... Open Architecture

Interviewed :D. EdenfeldRelevant Date :2005-03-29

Summary : Test Panel: D. Edenfeld, Intel on... Open Architecture

In 2003, Bernie Meyerson, CTO at IBM's Microelectronics Division, shocked the world, exclaiming, “Scaling is dead!” In this historic video, he describes how he saw the end simple lithographic scaling of int ... See more

Toshio Maruyama

05 Jan 2006

Advantest: What made it ...

Toshio Maruyama reflects on the history and future of Advantest and its role in semiconductor ATE. ... See more

Mark Jagiela

12 Aug 2003

Consolidation in the AT ...

Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on consolidation in the semiconductor test equipment industry, answering the question of why IC tester companies don't die. Semiconductor History b ... See more

Gary Heerssen

13 Jun 2007

Remembering a Manufactu ...

Gary Heerssen, AMD's Senior Vice President of Corporate Manufacturing, passed away on December 20, 2004. What a loss . . . to his family, to his coworkers, to AMD, and to the industry. I first got to know Gary ... See more

Mike Mayberry

08 May 2006

On Test

Mike Mayberry: VP, Technology and Manufacturing Group, Director of Components Research, Intel: On Test ... See more

Yan Borodovsky

19 Sep 2007

Yan Borodovsky with a d ...

Yan Borodovsky demonstrates what was new in DFM and Computational Lithography at Intel in this historic 2007 interview. In this video, Yan Borodovsky, follows up on the first interview with a demonstration that ... See more