Test Panel: F. Bode, Bode Enterprises on... Open Architecture

Interviewed :F. BodeRelevant Date :2005-03-29

Summary : Test Panel: F. Bode, Bode Enterprises on... Open Architecture

In 2003, Bernie Meyerson, CTO at IBM's Microelectronics Division, shocked the world, exclaiming, “Scaling is dead!” In this historic video, he describes how he saw the end simple lithographic scaling of int ... See more

Mark Jagiela

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Consolidation in the AT ...

Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on consolidation in the semiconductor test equipment industry, answering the question of why IC tester companies don't die. Semiconductor History b ... See more

Jerry Hutcheson

29 Nov 2004

Jerry Hutcheson and his ...

Jerry Hutcheson was honored for pioneering and developing relational databases on the equipment industry that could be consistently maintained and provide a valid history for better decision making. ... See more

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Mike Goldstein & Daisuke O ...

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First 450mm Wafer from ...

Nippon Mining & Metals: Daisuke Oka, Strategic Account Manager & Intel: Mike Goldstein, Principal-Materials Engineer: First 450mm Wafer from Nippon Mining & Metals ... See more

Scott Kulicke

04 Mar 2004

Assembly & Packaging Ch ...

Scott Kulicke, discusses the challenges going forward in semiconductor packaging and assembly in this 2004 interview. Topics covered include: productivity, effect of new wafer fab processes, early efforts to re ... See more

Keith Lee

30 Jun 2009

Advantest's strategies ...

Keith Lee: President and CEO, Advantest America: Advantest’s strategies during the downturn and the key drivers in Memory and SOC test ... See more