Is Test Adding More Value than Wafer Fab Today?

Summary : Jack Trautman, Senior Vice President and GM of Agilent’s ATG, addresses the question of the value test adds to the semiconductor industry in this 2003 interview. This was after Agilent was spun out from Hewlett-Packard and before it would be spun out to Verigy and then sold to Advantest.
Annexure :

Jack Trautman, Senior Vice President and GM of Agilent’s ATG, addresses the question of the value test adds to the semiconductor industry in this 2003 interview. This was after Agilent was spun out from Hewlett-Packard and before it would be spun out to Verigy and then sold to Advantest. Topics covered include: Characteristics of the ATE business. The two opinion camps on test value. What was happening new technically at the time. How it was keeping up with Moore’s Law with price-performance points that continually improve. How it differs by market. Importance of time-to-market and time-to-value at the time. The growing linkage between test and design. DFT technology and on-chip test vs SoC testers. Issue of test equipment obsolescence. Managing in a highly cyclical business and the business model needed.

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