Will a NGL emerge before EUV?

Interviewed :Bill Arnold, Gene Fuller, Phil WareRelevant Date :2013-10-22

Summary : Will there be a new wafer exposure technology before EUV makes it to production? Some Next Generation Lithography? In this historic video from 2003, Lithography experts, Bill Arnold, Gene Fuller, and Phil Ware discuss the issue. At the time, 193nm scanner

Bill Arnold, Gene Fuller, ...

22 Oct 2003

How is revenue recogniz ...

Chip execs, Bill Arnold, Gene Fuller, and Phil Ware weigh in on the then new FASB accounting standards for revenue recognition that affect semiconductor equipment companies. At the time it created lots of issue ... See more

Mark Bohr

09 Dec 2002

Intel at 90nm | The Chi ...

Mark Bohr, Intel Fellow, Director of Process Architecture and Integration discusses the launch of Intel's then new P1262 90nm Process in this historic interview. In 2002, 90nm was the cutting edge of semiconduc ... See more

John Bardeen

25 Apr 2007

John Bardeen and Transi ...

John Bardeen and Transistor Physics by Howard R. Huff, International SEMATECH ... See more

Dan Maydan

29 Nov 2005

The Early Days of Appli ...

Dan Maydan talks about the early days of turning Applied Materials into a technology company ... See more

Peter Rose

29 Nov 2004

Peter Rose: Father of I ...

How he turned a technology, critial to the future of Moore's Law and the semiconductor industry, into a success. ... See more

Bob Halliday

03 Sep 2005

The Role of CFO at a Se ...

Bob Halliday, Executive VP & CFO, Varian Semiconductor talks about managing the financial health of a Semiconductor Equipment Company soon after public companies made the transition into the Sarbanes-Oxley era. ... See more

Hans Stork on the role for ...

18 Jul 2003

The role for E-beam mas ...

Hans Stork addresses the role E-beam maskless lithography for low-volume semiconductor manufacturing in this historic 2003 video. Topics covered include: why the role for maskless lithography is not large: Cost ... See more

Keith Lee

30 Jun 2009

Advantest's strategies ...

Keith Lee: President and CEO, Advantest America: Advantest’s strategies during the downturn and the key drivers in Memory and SOC test ... See more

Dick Deininger

22 Apr 2003

Joint Process Developme ...

Dick Deininger on Joint Process Development with IBM ... See more

Jack Trautman

18 Nov 2003

Audience Q&A | The Chip ...

Jack Trautman, Sr VP & GM of ATE Group at Agilent: Audience Q&A ... See more