When Simple IC Scaling Died and the Semiconductor Technology Crisis Arrived

Summary : In 2003, Bernie Meyerson, CTO at IBM's Microelectronics Division, shocked the world, exclaiming, “Scaling is dead!” In this historic video, he describes how he saw the end simple lithographic scaling of integrated circuits coming and the R&D crisis that would ensue in the semiconductor industry. Bernie talks from a perspective of bringing up 65nm ICs in wafer fab production and process technology research on 45nm. Semiconductor History being made in the 2000’s: a historic vide ... See More

You may like this also:

Dan Maydan
On the 20th Anniversary ...
30 Nov 2007
On the 20th Anniversary ...

Applied Material's Precision 5000 changed the direction of tool architecture, lo ...

Applied Material's Precision 5000 changed the direction of tool architecture, lowering development cost and making it possible to bring new process technology to market faster than ever before. ... See more

Mihir Parikh
Mihir on the History of ...
13 Aug 2008
Mihir on the History of ...

Mihir on the History of Automation in the Semiconductor Industry

Mihir on the History of Automation in the Semiconductor Industry ... See more

G. Dan Hutcheson
The Shifting Winds of P ...
30 Apr 2008
The Shifting Winds of P ...

G. Dan Hutcheson: CEO of VLSI Research Inc: The Shifting Winds of Power

G. Dan Hutcheson: CEO of VLSI Research Inc: The Shifting Winds of Power ... See more

Mark Jagiela
Open ATE Architectures ...
12 Aug 2003
Open ATE Architectures ...

Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on the question o ...

Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on the question of the benefits of Multiple Test Platforms over Open Architectures for semiconductor companies testing of ICs. The semiconductor in ... See more

Bill Arnold
Lithography Panel 2007: ...
05 Nov 2007
Lithography Panel 2007: ...

Lithography Panel 2007: Bill Arnold, ASML

Lithography Panel 2007: Bill Arnold, ASML ... See more

Steve Wigley
Semiconductor Test Cons ...
05 Feb 2008
Semiconductor Test Cons ...

Semiconductor Test Consortium (STC) Panel 2008: Steve Wigley, LTX

Semiconductor Test Consortium (STC) Panel 2008: Steve Wigley, LTX ... See more

Phil Ware
Lithography Panel 2008: ...
18 Nov 2008
Lithography Panel 2008: ...

Lithography Panel 2008: Phil Ware, Canon

Lithography Panel 2008: Phil Ware, Canon ... See more

Jim Healy
Latest Trends in Design ...
15 Mar 2007
Latest Trends in Design ...

Jim Healy: President & CEO, LogicVision: Latest Trends in Design For Test

Jim Healy: President & CEO, LogicVision: Latest Trends in Design For Test ... See more

Hans Stork on decision-mak ...
Decision-making process ...
18 Jul 2003
Decision-making process ...

Hans Stork, then Senior Vice President of Silicon Technology Development at Texa ...

Hans Stork, then Senior Vice President of Silicon Technology Development at Texas Instruments, describes how decision-making processes in a technology development organization yields competitive advantage. ... See more

Mark Jagiela
Teradyne joining consor ...
12 Aug 2003
Teradyne joining consor ...

Mark Jagiela, President of Teradyne Semi Group, on... Teradyne joining consortiu ...

Mark Jagiela, President of Teradyne Semi Group, on... Teradyne joining consortium? ... See more

Access to and use of this Website is subject to VLSI's Terms of Use (including Copyright Policy & Claims) and Privacy Policy. By accessing or using this Website you agree to VLSI's Terms of Use (including Copyright Policy & Claims) and Privacy Policy.

Copyright © 2020 VLSI Research Inc. All rights reserved.