Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video. ATE was undergoing major change in the early 2000s as IC densities on SoC semiconductors had passed the point where they could be economically and effectively tested functionally. Tester prices and test times had exploded. Two great debates ensued over: 1) a move by chip makers to commoditize testers with an open standard and 2) structural test versus functional test. Originally taped in 2003, Paul Magliocco discusses how he saw these issues and how they would affect his start-up, Nextest. The company would later be bought by Teradyne in what would prove to be a very fruitful merger, due in part to the architectural decisions Nextest was making in the early 2000s. Topics covered include: Why structural test is not sufficient. Defect levels of tested parts is too high, so functional test is needed. What types of failures each covers. Stuck-at testing. AC test coverage.